Abstract
In this paper, natural heterogeneities of the potential on the degenerated semiconductor surface are discussed as well as the barrier height fluctuations in metal-semiconductor contacts. In the case of electroactive dopant linear screening, characteristic values of chaotic potential amplitudes have been defined. The dependence is shown of these heterogeneities on semiconductor electrophysical parameters.
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 17-23 |
| Seitenumfang | 7 |
| Fachzeitschrift | Key Engineering Material:KEM |
| Jahrgang | 806 |
| DOIs | |
| Publikationsstatus | Veröffentlicht - 11 Juni 2019 |
ASJC Scopus Sachgebiete
- Allgemeine Materialwissenschaften
- Werkstoffmechanik
- Maschinenbau
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