Characteristic-impedance measurement error on lossy substrates

Dylan F. Williams; Uwe Arz; Hartmut Grabinski

doi:10.1109/7260.933777

Characteristic-impedance measurement error on lossy substrates

Dylan F. Williams^*
, Uwe Arz
, Hartmut Grabinski

^*Korrespondierende*r Autor*in für diese Arbeit

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Abstract

The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.

Originalsprache	Englisch
Seiten (von - bis)	299-301
Seitenumfang	3
Fachzeitschrift	IEEE Microwave and Wireless Components Letters
Jahrgang	11
Ausgabenummer	7
DOIs	https://doi.org/10.1109/7260.933777
Publikationsstatus	Veröffentlicht - Juli 2001

ASJC Scopus Sachgebiete

Physik der kondensierten Materie
Elektrotechnik und Elektronik

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10.1109/7260.933777

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abstract = "The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.",

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