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Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm

  • Eric Eva
  • , Klaus Mann
  • , Norbert Kaiser
  • , B. Anton
  • , Rainer Henking
  • , Detlev Ristau
  • , P. Weissbrodt
  • , D. Mademann
  • , L. Raupach
  • , Erich Hacker

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Abstract

Highly reflective LaF3/MgF2 systems for a wavelength of 248 nm on MgF2 and crystalline quartz substrates were investigated. The influence of laser conditioning on damage threshold and absorptance was remarkable in those coatings that had a high initial absorptance. Monitoring with a laser calorimeter revealed the conditioning effect to be a function of the irradiation dose rather than of energy density or pulse rate. Furthermore, x-ray photoelectron spectroscopy and transmission electron microscopy investigations showed that conditioning induces stoichiometric and structural changes in the multilayers, especially in near-surface sublayers, whereas scanning electron microscopy and atomic force microscopy investigations indicated that the surface remains unchanged.

OriginalspracheEnglisch
Seiten (von - bis)5613-5619
Seitenumfang7
FachzeitschriftApplied Optics
Jahrgang35
Ausgabenummer28
DOIs
PublikationsstatusVeröffentlicht - 1 Okt. 1996
Extern publiziertJa

ASJC Scopus Sachgebiete

  • Atom- und Molekularphysik sowie Optik
  • Ingenieurwesen (sonstige)
  • Elektrotechnik und Elektronik

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