Projekte pro Jahr
Abstract
We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object's roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Proceedings |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 90-94 |
| Seitenumfang | 5 |
| ISBN (elektronisch) | 9781728157450 |
| ISBN (Print) | 978-1-7281-5744-3, 978-1-7281-5746-7 |
| DOIs | |
| Publikationsstatus | Veröffentlicht - 2020 |
| Veranstaltung | 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Santa Fe, USA / Vereinigte Staaten Dauer: 29 März 2020 → 31 März 2020 |
Publikationsreihe
| Name | Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation |
|---|---|
| Band | 2020-March |
Konferenz
| Konferenz | 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 |
|---|---|
| Land/Gebiet | USA / Vereinigte Staaten |
| Ort | Santa Fe |
| Zeitraum | 29 März 2020 → 31 März 2020 |
ASJC Scopus Sachgebiete
- Software
- Maschinelles Sehen und Mustererkennung
- Angewandte Informatik
Projekte
- 1 Abgeschlossen
-
PhoenixD: Exzellenzcluster 2122/1: Photonics, Optics, and Engineering – Innovation Across Disciplines
Morgner, U. (Projektleiter*in (Principal Investigator)) & Overmeyer, L. (Leitende*r Forscher*in (Co-Principal Investigator))
1 Jan. 2019 → 31 Dez. 2025
Projekt: Forschung
Dieses zitieren
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver