Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

Robert Witteck; Henning Schulte-Huxel; Boris Veith-Wolf; Malte Ruben Vogt; Fabian Kiefer; Marc Köntges; Robby Peibst; Rolf Brendel

doi:10.1109/pvsc.2017.8366232

Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

Robert Witteck
, Henning Schulte-Huxel
, Boris Veith-Wolf
, Malte Ruben Vogt
, Fabian Kiefer
, Marc Köntges
, Robby Peibst
, Rolf Brendel

Institut für Solarenergieforschung GmbH (ISFH)

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Abstract

We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIO_x), silicon nitride (SiN_y), and AlO_x/SiN_y, stacks under UV illumination. Low-temperature annealed AlO_x shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m². This degradation is less pronounced compared to that of fired SiN_y layers with an SRV of 117 cm/s. After a firing step, the AlO_x layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlO_x layer up to a large value of -1.2×10¹³ cm^-2.

Originalsprache	Englisch
Titel des Sammelwerks	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers Inc.
Seiten	1366-1370
Seitenumfang	5
ISBN (elektronisch)	978-1-5090-5605-7
ISBN (Print)	978-1-5090-5606-4
DOIs	https://doi.org/10.1109/pvsc.2017.8366232
Publikationsstatus	Veröffentlicht - 30 Juni 2017
Veranstaltung	44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, USA / Vereinigte Staaten Dauer: 25 Juni 2017 → 30 Juni 2017

Publikationsreihe

Name	Photovoltaic Specialist Conference
ISSN (Print)	0160-8371

Konferenz

Konferenz	44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Land/Gebiet	USA / Vereinigte Staaten
Ort	Washington
Zeitraum	25 Juni 2017 → 30 Juni 2017

UN-Ziele für nachhaltige Entwicklung (SDGs)

2015 einigten sich die UN-Mitgliedstaaten auf 17 globale Ziele für nachhaltige Entwicklung (Sustainable Development Goals, SDGs) zur Beendigung von Armut, zum Schutz des Planeten und zur Förderung des allgemeinen Wohlstands. Hiermit leisten wir einen Beitrag zu folgendem/n Ziel(en) für nachhaltige Entwicklung (SDGs):

SDG 7 Erschwingliche und saubere Energie

ASJC Scopus Sachgebiete

Erneuerbare Energien, Nachhaltigkeit und Umwelt
Elektrotechnik und Elektronik
Elektronische, optische und magnetische Materialien

Zugriff auf Dokument

10.1109/pvsc.2017.8366232

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Dieses zitieren

Witteck, R., Schulte-Huxel, H., Veith-Wolf, B., Vogt, M. R., Kiefer, F., Köntges, M., Peibst, R., & Brendel, R. (2017). Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (S. 1366-1370). (Photovoltaic Specialist Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/pvsc.2017.8366232

@inproceedings{865507b3a9794a63b1b2186e5e250cd3,

title = "Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers",

abstract = "We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.",

keywords = "Aluminum oxide, Carrier lifetime, Crystalline silicon, Degradation, Silicon nitride, Surface passivation, UV stability",

author = "Robert Witteck and Henning Schulte-Huxel and Boris Veith-Wolf and Vogt, \{Malte Ruben\} and Fabian Kiefer and Marc K{\"o}ntges and Robby Peibst and Rolf Brendel",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",

year = "2017",

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doi = "10.1109/pvsc.2017.8366232",

language = "English",

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Witteck, R, Schulte-Huxel, H, Veith-Wolf, B, Vogt, MR, Kiefer, F, Köntges, M, Peibst, R & Brendel, R 2017, Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Photovoltaic Specialist Conference, Institute of Electrical and Electronics Engineers Inc., S. 1366-1370, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, USA / Vereinigte Staaten, 25 Juni 2017. https://doi.org/10.1109/pvsc.2017.8366232

Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. / Witteck, Robert; Schulte-Huxel, Henning; Veith-Wolf, Boris et al.
2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. S. 1366-1370 (Photovoltaic Specialist Conference).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

TY - GEN

T1 - Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

AU - Witteck, Robert

AU - Schulte-Huxel, Henning

AU - Veith-Wolf, Boris

AU - Vogt, Malte Ruben

AU - Kiefer, Fabian

AU - Köntges, Marc

AU - Peibst, Robby

AU - Brendel, Rolf

PY - 2017/6/30

Y1 - 2017/6/30

N2 - We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.

AB - We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.

KW - Aluminum oxide

KW - Carrier lifetime

KW - Crystalline silicon

KW - Degradation

KW - Silicon nitride

KW - Surface passivation

KW - UV stability

UR - https://www.scopus.com/pages/publications/85048487136

U2 - 10.1109/pvsc.2017.8366232

DO - 10.1109/pvsc.2017.8366232

M3 - Conference contribution

SN - 978-1-5090-5606-4

T3 - Photovoltaic Specialist Conference

SP - 1366

EP - 1370

BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017

Y2 - 25 June 2017 through 30 June 2017

ER -

Witteck R, Schulte-Huxel H, Veith-Wolf B, Vogt MR, Kiefer F, Köntges M et al. Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. S. 1366-1370. (Photovoltaic Specialist Conference). doi: 10.1109/pvsc.2017.8366232