Equipments Details
Description
Atomic force microscope (Nanosurf CoreAFM). Easy-to-use AFM for research. Measuring modes: static force microscopy, lateral force microscopy, standard spectroscopy, standard lithography, dynamic force microscopy, phase contrast microscopy, force modulation mode, MFM, liquid imaging, "QuickPrescan" (up to 8 times faster and tip-friendly image preview), Kelvin probe force microscopy (KPFM), piezoresponse force microscopy (PFM)
Details
| Name | Rasterkraftmikroskop (Nanosurf CoreAFM) |
|---|---|
| Acquisition date | 1 Jan 2021 |