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FE-SEM Field-Emission Electron Microscope (JEOL JSM-6700F)

Facility/equipment: Research Instrumentation

Equipments Details

Description

with energy-dispersive X-ray spectrometer (Oxford Instruments INCA300), secondary electron contrast (SE), in-lens SE, backscattered electron contrast (BSE)

Research techniques

  • Electron microscopy > Scanning Electron Microscope (SEM)
  • Electron microscopy > Elemental analysis
  • Electron microscopy

Research Service (CoreNAT - Faculty of Natural Sciences)

  • Material Analytics