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FIB-Rasterelektronenmikroskop

Institute of Materials Science

Research infrastructure/Equipment: Major Research Instrumentation

    Equipments Details

    Description

    Feldemitter-Rasterelektronenmikroskop mit FIB (Focussed Ion Beam), EBSD, EDX

    Details

    NameAuriga
    Acquisition date1 Jan 2014
    ManufacturersCarl Zeiss AG

    DFG Instrumentation Classification Key

    • Optics, Electron Optics / Electron Optical Devices / 5120 Scanning Electron Microscopes (Reflective Light), with Field Emission Cathode

    Contact information

    Emails[email protected]
    LinksWebsite