Equipments Details
Description
The scanning electron microscope is equipped with a Schottky field emission cathode and two powerful EDX detectors. This enables qualitative chemical analyses of phases with a high detection limit and the creation of EDX maps of natural or experimental samples. The spatial resolution is in the nm range for imaging analyses. The following detectors are available for recordings: BSE, SEI and CL.
Details
| Name | JSM-7610F |
|---|---|
| Acquisition date | 1 Jan 2018 |
| Manufacturers | JEOL, Ltd |
Research Service (CoreNAT - Faculty of Natural Sciences)
- Material Analytics
Research techniques
- Electron microscopy > Scanning Electron Microscope (SEM)