Equipments Details
Description
Spectroscopic ellipsometry device: wavelength range 370 - 1,050 nm with heatable liquid chamber (5 - 70 °C) for measurements in liquid media to determine the layer thickness of thin films in air and in liquid media (1-200 nm)
Research Service (CoreNAT - Faculty of Natural Sciences)
- Surface Analytics
Research techniques
- Spectroscopy > Ellipsometry