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XPS X-Ray Photoelectron Spectrometer (PHI VersaProbe III, with UPS, Auger, Ar-Cluster-Beam etc.)

  • Andreas Schaate (Head)
Institute of Inorganic Chemistry

Research infrastructure/Equipment: Major Research Instrumentation

    Equipments Details

    Description

    Elemental analysis on surfaces, typical measuring range approx. 10 nm, depth profile measurements using Ar-Custer bombardment, binding/oxidation state of the elements can be determined

    Details

    NameVersaProbe III
    ManufacturersPhysical Electronics, Inc.

    DFG Instrumentation Classification Key

    • Instrumental Analytics and Preparative Chemistry Equipment / Spectrometers (Mass, NMR, ESR) / 1780 Photoelectron Spectrometers (PES, UPS, XPS)

    Research Service (CoreNAT - Faculty of Natural Sciences)

    • Material Analytics
    • Surface Analytics

    Research techniques

    • Surface analytics
    • Spectroscopy > X-ray Photoelectron Spectroscopy (XPS)

    Contact information

    Phone05117623698
    Emails[email protected]
    LinksCoreNAT Material Analytics, CoreNAT Surface Analytics