Skip to main navigation Skip to search Skip to main content

XRD Fine-Structure X-Ray Diffractometer (Bruker D8 Advance) with in-situ measuring cell (Anton Paar HTK 1200N)

Research infrastructure/Equipment: Research Instrumentation

Equipments Details

Research Service (CoreNAT - Faculty of Natural Sciences)

  • Material Analytics
  • Surface Analytics

Research techniques

  • X-ray diffraction (XRD)
  • Crystallography