Abstract
We present a study about loss analysis in both-sides-contacted silicon solar cells from a porous silicon (PSI) layer transfer process. Experimental results achieved by a variation of the rear-side contact geometry are characterized by different techniques such as electroluminescence and quantum efficiency measurements and reproduced by 3-D simulations using Sentaurus Device. Since such a device simulation does not include resistive losses in the metallization, we use a network simulation to account for losses caused by the grid. Considering the optimal contact geometry, the simulations indicate the power losses in the emitter, at the rear-side contacts, in the base, and in the metallization grid to be in the same order of magnitude.
| Original language | English |
|---|---|
| Article number | 6146417 |
| Pages (from-to) | 909-917 |
| Number of pages | 9 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 59 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 6 Feb 2012 |
Keywords
- Kerfless
- layer transfer
- loss analysis
- porous silicon (PSI)
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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