Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Thomas Michael Winkel; Lohit Sagar Dutta; Hartmut Grabinski

doi:10.1109/MCMC.1996.510793

Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Thomas Michael Winkel^*
, Lohit Sagar Dutta
, Hartmut Grabinski

^*Corresponding author for this work

Research output: Contribution to conference › Paper › Research › peer review

Abstract

A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

Original language	English
Pages	190-195
Number of pages	6
DOIs	https://doi.org/10.1109/MCMC.1996.510793
Publication status	Published - 1996
Event	1996 IEEE Multi-Chip Module Conference - Santa Cruz, United States Duration: 6 Feb 1996 → 7 Feb 1996

Conference

Conference	1996 IEEE Multi-Chip Module Conference
Country/Territory	United States
City	Santa Cruz
Period	6 Feb 1996 → 7 Feb 1996

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/MCMC.1996.510793

Cite this

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title = "Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements",

abstract = "A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.",

author = "Winkel, \{Thomas Michael\} and Dutta, \{Lohit Sagar\} and Hartmut Grabinski",

year = "1996",

doi = "10.1109/MCMC.1996.510793",

language = "English",

pages = "190--195",

note = "1996 IEEE Multi-Chip Module Conference ; Conference date: 06-02-1996 Through 07-02-1996",

}

Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements. / Winkel, Thomas Michael; Dutta, Lohit Sagar; Grabinski, Hartmut.
1996. 190-195 Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States.

Research output: Contribution to conference › Paper › Research › peer review

TY - CONF

T1 - Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

AU - Winkel, Thomas Michael

AU - Dutta, Lohit Sagar

AU - Grabinski, Hartmut

PY - 1996

Y1 - 1996

N2 - A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

AB - A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

UR - https://www.scopus.com/pages/publications/0029771322

U2 - 10.1109/MCMC.1996.510793

DO - 10.1109/MCMC.1996.510793

M3 - Paper

AN - SCOPUS:0029771322

SP - 190

EP - 195

T2 - 1996 IEEE Multi-Chip Module Conference

Y2 - 6 February 1996 through 7 February 1996

ER -

Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

Abstract

Conference

ASJC Scopus subject areas

Access to Document

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