Abstract
Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781728155791 |
| ISBN (Print) | 978-1-7281-5578-4, 978-1-7281-5580-7 |
| DOIs | |
| Publication status | Published - 2020 |
| Event | 2020 International Symposium on Electromagnetic Compatibility: EMC EUROPE 2020 - Virtual, Rome, Italy Duration: 23 Sept 2020 → 25 Sept 2020 |
Conference
| Conference | 2020 International Symposium on Electromagnetic Compatibility |
|---|---|
| Country/Territory | Italy |
| City | Virtual, Rome |
| Period | 23 Sept 2020 → 25 Sept 2020 |
Keywords
- conducted interference
- IEMI
- microcontroller
- PCB design
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Radiation
- Computer Networks and Communications
- Hardware and Architecture
- Aerospace Engineering
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