Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

Robert Witteck; Henning Schulte-Huxel; Boris Veith-Wolf; Malte Ruben Vogt; Fabian Kiefer; Marc Köntges; Robby Peibst; Rolf Brendel

doi:10.1109/pvsc.2017.8366232

Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

Robert Witteck
, Henning Schulte-Huxel
, Boris Veith-Wolf
, Malte Ruben Vogt
, Fabian Kiefer
, Marc Köntges
, Robby Peibst
, Rolf Brendel

Institute for Solar Energy Research (ISFH)

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Abstract

We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIO_x), silicon nitride (SiN_y), and AlO_x/SiN_y, stacks under UV illumination. Low-temperature annealed AlO_x shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m². This degradation is less pronounced compared to that of fired SiN_y layers with an SRV of 117 cm/s. After a firing step, the AlO_x layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlO_x layer up to a large value of -1.2×10¹³ cm^-2.

Original language	English
Title of host publication	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1366-1370
Number of pages	5
ISBN (Electronic)	978-1-5090-5605-7
ISBN (Print)	978-1-5090-5606-4
DOIs	https://doi.org/10.1109/pvsc.2017.8366232
Publication status	Published - 30 Jun 2017
Event	44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States Duration: 25 Jun 2017 → 30 Jun 2017

Publication series

Name	Photovoltaic Specialist Conference
ISSN (Print)	0160-8371

Conference

Conference	44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/Territory	United States
City	Washington
Period	25 Jun 2017 → 30 Jun 2017

UN Sustainable Development Goals (SDGs)

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Aluminum oxide
Carrier lifetime
Crystalline silicon
Degradation
Silicon nitride
Surface passivation
UV stability

ASJC Scopus subject areas

Renewable Energy, Sustainability and the Environment
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/pvsc.2017.8366232

Cite this

Witteck, R., Schulte-Huxel, H., Veith-Wolf, B., Vogt, M. R., Kiefer, F., Köntges, M., Peibst, R., & Brendel, R. (2017). Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1366-1370). (Photovoltaic Specialist Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/pvsc.2017.8366232

@inproceedings{865507b3a9794a63b1b2186e5e250cd3,

title = "Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers",

abstract = "We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.",

keywords = "Aluminum oxide, Carrier lifetime, Crystalline silicon, Degradation, Silicon nitride, Surface passivation, UV stability",

author = "Robert Witteck and Henning Schulte-Huxel and Boris Veith-Wolf and Vogt, \{Malte Ruben\} and Fabian Kiefer and Marc K{\"o}ntges and Robby Peibst and Rolf Brendel",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",

year = "2017",

month = jun,

day = "30",

doi = "10.1109/pvsc.2017.8366232",

language = "English",

isbn = "978-1-5090-5606-4",

series = "Photovoltaic Specialist Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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address = "United States",

}

Witteck, R, Schulte-Huxel, H, Veith-Wolf, B, Vogt, MR, Kiefer, F, Köntges, M, Peibst, R & Brendel, R 2017, Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Photovoltaic Specialist Conference, Institute of Electrical and Electronics Engineers Inc., pp. 1366-1370, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 25 Jun 2017. https://doi.org/10.1109/pvsc.2017.8366232

Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. / Witteck, Robert; Schulte-Huxel, Henning; Veith-Wolf, Boris et al.
2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1366-1370 (Photovoltaic Specialist Conference).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

TY - GEN

T1 - Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

AU - Witteck, Robert

AU - Schulte-Huxel, Henning

AU - Veith-Wolf, Boris

AU - Vogt, Malte Ruben

AU - Kiefer, Fabian

AU - Köntges, Marc

AU - Peibst, Robby

AU - Brendel, Rolf

PY - 2017/6/30

Y1 - 2017/6/30

N2 - We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.

AB - We report on the stability of the c-Si surface passivation quality by aluminum oxide (AIOx), silicon nitride (SiNy), and AlOx/SiNy, stacks under UV illumination. Low-temperature annealed AlOx shows a weak degradation during UV illumination, with surface recombination velocities (SRVs) of 25 cm/s after a UV dose of 275 kWh/m2. This degradation is less pronounced compared to that of fired SiNy layers with an SRV of 117 cm/s. After a firing step, the AlOx layer show even an improvement during UV illumination, resulting in stabilized SRVs of down to 1 cm/s. The improvement is mainly due to an increase of the negative fixed charge density in the AlOx layer up to a large value of -1.2×1013 cm-2.

KW - Aluminum oxide

KW - Carrier lifetime

KW - Crystalline silicon

KW - Degradation

KW - Silicon nitride

KW - Surface passivation

KW - UV stability

UR - https://www.scopus.com/pages/publications/85048487136

U2 - 10.1109/pvsc.2017.8366232

DO - 10.1109/pvsc.2017.8366232

M3 - Conference contribution

SN - 978-1-5090-5606-4

T3 - Photovoltaic Specialist Conference

SP - 1366

EP - 1370

BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017

Y2 - 25 June 2017 through 30 June 2017

ER -

Witteck R, Schulte-Huxel H, Veith-Wolf B, Vogt MR, Kiefer F, Köntges M et al. Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 1366-1370. (Photovoltaic Specialist Conference). doi: 10.1109/pvsc.2017.8366232

Reducing UV induced degradation losses of solar modules with c-Si solar cells featuring dielectric passivation layers

Abstract

Publication series

Conference

UN Sustainable Development Goals (SDGs)

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this