Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen

Peter Reiser; Heyno Garbe; Dietmar Giselbrecht

Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen

Translated title of the contribution: Dietmar Giselbrecht: Increased sensitivity at near-field measurements on metal housings

Peter Reiser
, Heyno Garbe
, Dietmar Giselbrecht

Institute of Electrical Engineering and Measurement Technology

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Translated title of the contribution	Dietmar Giselbrecht: Increased sensitivity at near-field measurements on metal housings
Original language	German
Title of host publication	EMC 2006
Subtitle of host publication	International Trade Fair and Conference on Electromagnetic Compatibility
Pages	245-252
Number of pages	8
Publication status	Published - 2006
Event	International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 - Düsseldorf, Germany Duration: 7 Mar 2006 → 9 Mar 2006

Publication series

Name	EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility

Conference

Conference	International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006
Country/Territory	Germany
City	Düsseldorf
Period	7 Mar 2006 → 9 Mar 2006

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@inproceedings{fdf9d4449d8e4d1fa4a50f6b76fccd62,

title = "Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgeh{\"a}usen",

author = "Peter Reiser and Heyno Garbe and Dietmar Giselbrecht",

year = "2006",

language = "Deutsch",

isbn = "3800729334",

series = "EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility",

pages = "245--252",

booktitle = "EMC 2006",

note = "International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 ; Conference date: 07-03-2006 Through 09-03-2006",

}

Reiser, P, Garbe, H & Giselbrecht, D 2006, Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. in EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility, pp. 245-252, International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006, Düsseldorf, Germany, 7 Mar 2006.

Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. / Reiser, Peter; Garbe, Heyno; Giselbrecht, Dietmar.
EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. p. 245-252 (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

TY - GEN

T1 - Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen

AU - Reiser, Peter

AU - Garbe, Heyno

AU - Giselbrecht, Dietmar

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/84881423615

M3 - Aufsatz in Konferenzband

SN - 3800729334

SN - 9783800729333

T3 - EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility

SP - 245

EP - 252

BT - EMC 2006

T2 - International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006

Y2 - 7 March 2006 through 9 March 2006

ER -

Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen

Publication series

Conference

ASJC Scopus subject areas

Other files and links

Cite this