Abstract
A silica-based planar echelle grating (PEG) with high resolution and ultra-low crosstalk is designed, fabricated, and characterized for an integrated spectrometer optimized for C-band operation. By leveraging mature silica waveguide fabrication technology and a large Rowland circle, the PEG exhibits both excellent robustness and superior optical performance. The experimental results demonstrate lowest on-chip loss of 0.9 dB across 14 output channels, with an average inter-channel crosstalk of -45 dB. The device further achieves a narrow 3-dB bandwidth of 0.24 nm, corresponding to a resolving power exceeding 6000, together with a highly accurate realization of the designed 1.5 nm channel spacing. These results highlight silica PEGs as robust, high-performance candidates for wavelength-division multiplexers in fiber-optic communication networks and as spectroscopy interrogators in fiber Bragg grating sensing systems for the precise determination of wavelength shifts.
| Original language | English |
|---|---|
| Pages (from-to) | 1106-1109 |
| Number of pages | 4 |
| Journal | IEEE photonics technology letters |
| Volume | 38 |
| Issue number | 15 |
| E-pub ahead of print | 6 Feb 2026 |
| DOIs | |
| Publication status | E-pub ahead of print - 6 Feb 2026 |
Keywords
- FBG sensing
- integrated optics
- integrated spectrometer
- planar echelle gratings
- Planar echelle gratings
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering
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